Ion-beam sputtered amorphous silicon films for cryogenic precision measurement systems (2015)

First Author: Murray Peter G.
Attributed to:  Investigations in Gravitational Radiation funded by STFC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1103/PhysRevD.92.062001

Publication URI: http://dx.doi.org/10.1103/PhysRevD.92.062001

Type: Journal Article/Review

Volume: 92

Parent Publication: PHYSICAL REVIEW D

Issue: 6

ISSN: 1550-7998