Sn whisker evaluations in 3D microbumped structures (2014)

First Author: Vakanas G
Attributed to:  An Innovative Electronics Manufacturing Research Centre funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2014.07.110

Publication URI: http://dx.doi.org/10.1016/j.microrel.2014.07.110

Type: Journal Article/Review

Parent Publication: Microelectronics Reliability

Issue: 9-10

ISSN: 0026-2714