Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope. (2012)
Attributed to:
Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1103/physrevlett.108.135503
PubMed Identifier: 22540714
Publication URI: http://europepmc.org/abstract/MED/22540714
Type: Journal Article/Review
Volume: 108
Parent Publication: Physical review letters
Issue: 13
ISSN: 0031-9007