High-Resolution Electron Backscatter Diffraction in III-Nitride Semiconductors (2015)
Attributed to:
Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1017/s1431927615011861
Publication URI: http://dx.doi.org/10.1017/s1431927615011861
Type: Journal Article/Review
Parent Publication: Microscopy and Microanalysis
Issue: S3