Investigation of Parasitic Edge Recombination in High-Lifetime Oxidized <i>n</i>-Si (2015)

First Author: Bonilla R

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.4028/www.scientific.net/SSP.242.73

Publication URI: http://dx.doi.org/10.4028/www.scientific.net/SSP.242.73

Type: Journal Article/Review

Parent Publication: Solid State Phenomena