Modeling Transport of Secondary Ion Fragments into a Mass Spectrometer (2015)

First Author: Warmenhoven J
Attributed to:  Ambient Pressure Mass Spectrometry at the Sub Micron Scale funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.phpro.2015.05.044

Publication URI: http://dx.doi.org/10.1016/j.phpro.2015.05.044

Type: Journal Article/Review

Parent Publication: Physics Procedia