Microstructural evolution of nanometric Ti(NiCu)2 precipitates in annealed Ni-Ti-Cu thin films (2015)

First Author: Callisti M
Attributed to:  Micro Materials NanoTest Vantage Testing Suite with NTX4Controller funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.vacuum.2015.03.028

Publication URI: http://dx.doi.org/10.1016/j.vacuum.2015.03.028

Type: Journal Article/Review

Parent Publication: Vacuum