Randomised Testing of a Microprocessor Model Using SMT-Solver State Generation
Attributed to:
REMS: Rigorous Engineering for Mainstream Systems
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1007/978-3-319-10702-8_13
Publication URI: http://dx.doi.org/10.1007/978-3-319-10702-8_13
Type: Book Chapter
Book Title: Formal Methods for Industrial Critical Systems (2014)
Page Reference: 185-199
ISBN: 978-3-319-10701-1