3D ToF-SIMS Imaging of Polymer Multilayer Films Using Argon Cluster Sputter Depth Profiling (2015)
Attributed to:
University of Nottingham - Equipment Account
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/am507663v
PubMed Identifier: 25562665
Publication URI: http://europepmc.org/abstract/MED/25562665
Type: Journal Article/Review
Parent Publication: ACS Applied Materials & Interfaces
Issue: 4
ISSN: 1944-8244