A method for accurate texture determination of thin oxide films by glancing-angle laboratory X-ray diffraction (2014)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1107/S1600576714000569

Publication URI: http://dx.doi.org/10.1107/S1600576714000569

Type: Journal Article/Review

Parent Publication: Journal of Applied Crystallography

Issue: 2