Tutorial: Crystal orientations and EBSD - Or which way is up? (2016)
Attributed to:
Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.matchar.2016.04.008
Publication URI: http://dx.doi.org/10.1016/j.matchar.2016.04.008
Type: Journal Article/Review
Parent Publication: Materials Characterization