Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications (2016)

First Author: Arnaud Q

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/11/10/P10008

Publication URI: http://dx.doi.org/10.1088/1748-0221/11/10/P10008

Type: Journal Article/Review

Parent Publication: Journal of Instrumentation

Issue: 10