A specimen-tracking controller for the transverse dynamic force microscope in non-contact mode (2016)
Attributed to:
Robustness and adaptivity: advanced control and estimation algorithms for the transverse dynamic atomic force microscope
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/acc.2016.7526838
Publication URI: http://dx.doi.org/10.1109/acc.2016.7526838
Type: Conference/Paper/Proceeding/Abstract