First principles modeling of electron tunneling between defects in m-HfO2 (2015)

First Author: McKenna K
Attributed to:  Non-equilibrium electron-ion dynamics in thin metal-oxide films funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.mee.2015.04.009

Publication URI: http://dx.doi.org/10.1016/j.mee.2015.04.009

Type: Journal Article/Review

Parent Publication: Microelectronic Engineering

ISSN: 0167-9317