Susceptible workload driven selective fault tolerance using a probabilistic fault model (2016)
Attributed to:
Resilient and Testable Energy-Efficient Digital Hardware
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/iolts.2016.7604682
Publication URI: http://dx.doi.org/10.1109/iolts.2016.7604682
Type: Conference/Paper/Proceeding/Abstract