UIS failure mechanism of SiC power MOSFETs (2016)

First Author: Fayyaz A
Attributed to:  Underpinning Power Electronics 2012: Devices Theme funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/wipda.2016.7799921

Publication URI: http://dx.doi.org/10.1109/wipda.2016.7799921

Type: Conference/Paper/Proceeding/Abstract