Specimen preparation methods for elemental characterisation of grain boundaries and isolated dislocations in multicrystalline silicon using atom probe tomography (2017)

First Author: Lotharukpong C
Attributed to:  SuperSilicon PV: extending the limits of material performance funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.matchar.2017.07.038

Publication URI: http://dx.doi.org/10.1016/j.matchar.2017.07.038

Type: Journal Article/Review

Parent Publication: Materials Characterization