Correlated resistive/capacitive state variability in solid TiO2 based memory devices (2017)

First Author: Li Q

Attributed to: Reliably unreliable nanotechnologies funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/s00339-017-0991-5

Publication URI: http://dx.doi.org/10.1007/s00339-017-0991-5

Type: Journal Article/Review

Parent Publication: Applied Physics A

Issue: 5