Temporary Surface Passivation for Characterisation of Bulk Defects in Silicon: A Review (2017)

First Author: Grant N

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/pssr.201700243

Publication URI: http://dx.doi.org/10.1002/pssr.201700243

Type: Journal Article/Review

Parent Publication: physica status solidi (RRL) - Rapid Research Letters

Issue: 11