An integrated and multi-purpose microscope for the characterization of atomically thin optoelectronic devices. (2017)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4982358

PubMed Identifier: 28571447

Publication URI: http://europepmc.org/abstract/MED/28571447

Type: Journal Article/Review

Volume: 88

Parent Publication: The Review of scientific instruments

Issue: 5

ISSN: 0034-6748