X-ray reflectivity method for the characterization of InGaN/GaN quantum well interface X-ray reflectivity for characterization of InGaN/GaN QW interface (2017)

First Author: Massabuau F

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/pssb.201600664

Publication URI: http://dx.doi.org/10.1002/pssb.201600664

Type: Journal Article/Review

Parent Publication: physica status solidi (b)

Issue: 8