Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction. (2017)
Attributed to:
Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1038/s41598-017-11187-z
PubMed Identifier: 28883500
Publication URI: http://europepmc.org/abstract/MED/28883500
Type: Journal Article/Review
Volume: 7
Parent Publication: Scientific reports
Issue: 1
ISSN: 2045-2322