A synchrotron X-ray diffraction deconvolution method for the measurement of residual stress in thermal barrier coatings as a function of depth. (2016)

First Author: Li C
Attributed to:  Next Generation Multi-Dimensional X-Ray Imaging funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1107/S1600576716013935

PubMed Identifier: 27980507

Publication URI: http://europepmc.org/abstract/MED/27980507

Type: Journal Article/Review

Volume: 49

Parent Publication: Journal of applied crystallography

Issue: Pt 6

ISSN: 0021-8898