Measurements of the reverse current of highly irradiated silicon sensors to determine the effective energy and current related damage rate (2018)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.nima.2017.09.021

Publication URI: http://dx.doi.org/10.1016/j.nima.2017.09.021

Type: Journal Article/Review

Parent Publication: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment