Comparing signal intensity and refraction sensitivity of double and single mask edge illumination lab-based x-ray phase contrast imaging set-ups (2017)
Attributed to:
Transforming the use of x-rays in science and society
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6463/aa8692
Publication URI: http://dx.doi.org/10.1088/1361-6463/aa8692
Type: Journal Article/Review
Parent Publication: Journal of Physics D: Applied Physics
Issue: 41