Predicting SiC MOSFET Behavior Under Hard-Switching, Soft-Switching, and False Turn-On Conditions (2017)

First Author: Ahmed M

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/TIE.2017.2721882

Publication URI: http://dx.doi.org/10.1109/TIE.2017.2721882

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Industrial Electronics

Issue: 11