Residual stress evaluation at the micro- and nano-scale: Recent advancements of measurement techniques, validation through modelling, and future challenges (2017)

First Author: Sebastiani M
Attributed to:  Multi-disciplinary Centre for In-situ Processing Studies (CIPS) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.matdes.2017.01.025

Publication URI: http://dx.doi.org/10.1016/j.matdes.2017.01.025

Type: Journal Article/Review

Parent Publication: Materials & Design

ISSN: 0264-1275