Improved Testing Capability of the Model-Assisted Testing Scheme for a Modular Multilevel Converter (2016)

First Author: Tang Y
Attributed to:  High Current Module and Technologies Optimised for HVDC funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tpel.2016.2514439

Publication URI: http://dx.doi.org/10.1109/tpel.2016.2514439

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Power Electronics

Issue: 11

ISSN: 08858993