A Temperature Gradient-Based Potential Defects Identification Method for IGBT Module (2017)

First Author: Gao B

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/TPEL.2016.2565701

Publication URI: http://dx.doi.org/10.1109/TPEL.2016.2565701

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Power Electronics

Issue: 3

ISSN: 08858993