A Temperature Gradient-Based Potential Defects Identification Method for IGBT Module (2017)
Attributed to:
High Current Module and Technologies Optimised for HVDC
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tpel.2016.2565701
Publication URI: http://dx.doi.org/10.1109/tpel.2016.2565701
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Power Electronics
Issue: 3
ISSN: 08858993