Characterization, Modelling and Analysis of Light Reflectance During In-Process Surface Measurements Using White Light Based 3D Optical Gauge (2017)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1115/msec2017-2689

Publication URI: http://dx.doi.org/10.1115/msec2017-2689

Type: Conference/Paper/Proceeding/Abstract