Characterization of Epitaxial Heavily Doped Silicon Regions Formed by Hot-Wire Chemical Vapor Deposition Using Micro-Raman and Microphotoluminescence Spectroscopy (2018)
Attributed to:
Improved Understanding, Development and Optimisation of Perovskite-based Solar Cells
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/jphotov.2018.2818284
Publication URI: http://dx.doi.org/10.1109/jphotov.2018.2818284
Type: Journal Article/Review
Parent Publication: IEEE Journal of Photovoltaics
Issue: 3