Fast, Noncontact, Wafer-Scale, Atomic Layer Resolved Imaging of Two-Dimensional Materials by Ellipsometric Contrast Micrography (2018)

First Author: Braeuninger-Weimer P
Attributed to:  CVD enabled Graphene Technology and Devices (GRAPHTED) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsnano.8b04167

PubMed Identifier: 30080966

Publication URI: http://europepmc.org/abstract/MED/30080966

Type: Journal Article/Review

Parent Publication: ACS Nano

Issue: 8

ISSN: 1936-0851