Performance Enhancement of Al 2 O 3 /H-Diamond MOSFETs Utilizing Vacuum Annealing and V 2 O 5 as a Surface Electron Acceptor (2018)
Attributed to:
Ultra short gate length diamond FETs for high power/high frequency applications
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/led.2018.2856920
Publication URI: http://dx.doi.org/10.1109/led.2018.2856920
Type: Journal Article/Review
Parent Publication: IEEE Electron Device Letters
Issue: 9