Effect of grain cutting in exchange biased nanostructures (2014)
Attributed to:
High-resolution Electron Beam Lithography Critical Mass Grant
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4868328
Publication URI: http://dx.doi.org/10.1063/1.4868328
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 17