A Multimode Transverse Dynamic Force Microscope-Design, Identification, and Control (2020)
Attributed to:
Robustness and adaptivity: advanced control and estimation algorithms for the transverse dynamic atomic force microscope
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tie.2019.2924618
Publication URI: http://dx.doi.org/10.1109/tie.2019.2924618
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Industrial Electronics
Issue: 6