Simulation Study of Overlap Capacitance in Source-Gated Transistors for Current-Mode Pixel Drivers (2019)

First Author: Drury R
Attributed to:  Design for high-yield manufacturing of printed circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2019.2926351

Publication URI: http://dx.doi.org/10.1109/led.2019.2926351

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 9