A novel feature extraction method of eddy current testing for defect detection based on machine learning (2019)

First Author: Yin L

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ndteint.2019.04.005

Publication URI: http://dx.doi.org/10.1016/j.ndteint.2019.04.005

Type: Journal Article/Review

Parent Publication: NDT & E International