Robustness and reliability review of Si and SiC FET devices for more-electric-aircraft applications (2019)

First Author: Ortiz Gonzalez J
Attributed to:  Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2019.06.016

Publication URI: http://dx.doi.org/10.1016/j.microrel.2019.06.016

Type: Journal Article/Review

Parent Publication: Microelectronics Reliability