Improving the Consistency of Nanoscale Etching for Atomic Force Microscopy Tomography Applications (2019)
Attributed to:
Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.3389/fmats.2019.00203
Publication URI: http://dx.doi.org/10.3389/fmats.2019.00203
Type: Journal Article/Review
Parent Publication: Frontiers in Materials