Influence of annealing on the electrical characteristic of GaSbBi Schottky diodes (2019)

First Author: Cao Z
Attributed to:  X-RAY DIFFRACTION CAPABILITY FOR NANOSCALE AND THIN FILM STRUCTURE funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.5108870

Publication URI: http://dx.doi.org/10.1063/1.5108870

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 5