Modular thermal Hall effect measurement setup for fast-turnaround screening of materials over wide temperature range using capacitive thermometry (2019)
Attributed to:
Single Crystal Growth at Warwick
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.5108512
Publication URI: http://dx.doi.org/10.1063/1.5108512
Type: Journal Article/Review
Parent Publication: Review of Scientific Instruments
Issue: 10