EF93DDBB-2EDE-4070-ACA9-6BB657F808D1Ion Beam Analysis for the 2020's and Beyond: An Integration of Elemental Mapping and 'omics'FellowshipEP/R031118/1798CB33D-C79E-4578-83F2-72606407192CEPSRCINCOME_ACTUAL1025483567D46F1-D071-4CC8-A276-8AA4E8993F63Determination of Deposition Order of Toners, Inkjet Inks, and Blue Ballpoint Pen Combining MeV-Secondary Ion Mass Spectrometry and Particle Induced X-ray Emission.Analytical chemistry0ce310fba15e96dc5b215771505129b2Moore KL2019-01-01http://dx.doi.org/10.1021/acs.analchem.9b0305831525914http://ukpmc.ac.uk/abstract/MED/315259140003-2700http://europepmc.org/abstract/MED/315259149120Journal Article/Review5e2b38d67c8d49.41229999