Submicrometer Resolution Hyperspectral Quantum Rod Thermal Imaging of Microelectronic Devices (2020)

First Author: ├ľner B

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsaelm.9b00575

Publication URI: http://dx.doi.org/10.1021/acsaelm.9b00575

Type: Journal Article/Review

Parent Publication: ACS Applied Electronic Materials