Single-Ion Deconvolution of Mass Peak Overlaps for Atom Probe Microscopy. (2017)

First Author: London AJ

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927616012782

PubMed Identifier: 28300014

Publication URI: http://europepmc.org/abstract/MED/28300014

Type: Journal Article/Review

Volume: 23

Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Issue: 2

ISSN: 1431-9276