Single-Ion Deconvolution of Mass Peak Overlaps for Atom Probe Microscopy (2017)

First Author: London A

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/S1431927616012782

PubMed Identifier: 28300014

Publication URI: http://europepmc.org/abstract/MED/28300014

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: 2

ISSN: 1431-9276