Efficiently measuring a quantum device using machine learning (2019)
Attributed to:
Quantum Technology Capital: An extensible simulation and test platform for quantum and quantum enabled technologies
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1038/s41534-019-0193-4
Publication URI: http://dx.doi.org/10.1038/s41534-019-0193-4
Type: Journal Article/Review
Parent Publication: npj Quantum Information
Issue: 1