Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films (2019)

First Author: Trager-Cowan C

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/PRJ.7.000B73

Publication URI: http://dx.doi.org/10.1364/PRJ.7.000B73

Type: Journal Article/Review

Parent Publication: Photonics Research

Issue: 11