Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets. (2019)
Attributed to:
Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2018.09.011
PubMed Identifier: 30326378
Publication URI: http://europepmc.org/abstract/MED/30326378
Type: Journal Article/Review
Volume: 196
Parent Publication: Ultramicroscopy
ISSN: 0304-3991