Analysis of Ultrahigh Apparent Mobility in Oxide Field-Effect Transistors. (2019)

First Author: Chen C

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/advs.201801189

PubMed Identifier: 30989018

Publication URI: http://europepmc.org/abstract/MED/30989018

Type: Journal Article/Review

Volume: 6

Parent Publication: Advanced science (Weinheim, Baden-Wurttemberg, Germany)

Issue: 7

ISSN: 2198-3844