Pattern Matching and Active Simulation Method for Process Fault Diagnosis (2020)

First Author: Li W

Attributed to: Stepping towards the industrial 6th Sense funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acs.iecr.0c02424

Publication URI: http://dx.doi.org/10.1021/acs.iecr.0c02424

Type: Journal Article/Review

Parent Publication: Industrial & Engineering Chemistry Research

Issue: 27