Ultrathin Ion-Sensitive Field-Effect Transistor Chips with Bending-Induced Performance Enhancement. (2020)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsaelm.0c00489

PubMed Identifier: 32904936

Publication URI: http://europepmc.org/abstract/MED/32904936

Type: Journal Article/Review

Volume: 2

Parent Publication: ACS applied electronic materials

Issue: 8

ISSN: 2637-6113